Structural and optical analysis of SnO2 thin films BY Spray Pyrolysis

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dc.contributor.authorSabrina Roguai 1
dc.contributor.authorAbdelkader Djelloul 2
dc.date.accessioned2024-02-14T21:17:32Z
dc.date.available2024-02-14T21:17:32Z
dc.date.issued2022-03-16
dc.description/
dc.description.abstractSnO2 thin films were deposited by ultrasound pyrolysis spray technique at 450°C. The films were characterized by X-ray diffraction, Fourier transformed infrared (FTIR), ultraviolet–visible and Photoluminescence spectroscopy. The tetragonal rutile-type structure was confirmed by X-ray diffraction with an average crystallite size of 35 nm. In addition, the FTIR study indicated the existence of two distinct characteristic absorptions which correspond to (0-Sn-O) deformations and (O-Sn) stretching modes. For the optical properties, the band gap energy was determined by Wemple DiDomenico model. PL properties are ascribed to the presence of intrinsic defects.
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dc.identifier.citation1
dc.identifier.issn2437-1114
dc.identifier.urihttp://dspace.univ-khenchela.dz:4000/handle/123456789/1025
dc.language.isoen
dc.publisherAlgerian Journal of Environmental Science and Technology, www.aljest.org
dc.relation.ispartofseries8(2022)1; 8
dc.titleStructural and optical analysis of SnO2 thin films BY Spray Pyrolysis
dc.typeArticle
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