Structural and optical analysis of SnO2 thin films BY Spray Pyrolysis
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Date
2022-03-16
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Algerian Journal of Environmental Science and Technology, www.aljest.org
Abstract
SnO2 thin films were deposited by ultrasound pyrolysis
spray technique at 450°C. The films were characterized by X-ray
diffraction, Fourier transformed infrared (FTIR), ultraviolet–visible
and Photoluminescence spectroscopy. The tetragonal rutile-type
structure was confirmed by X-ray diffraction with an average
crystallite size of 35 nm. In addition, the FTIR study indicated the
existence of two distinct characteristic absorptions which correspond
to (0-Sn-O) deformations and (O-Sn) stretching modes. For the
optical properties, the band gap energy was determined by Wemple DiDomenico model. PL properties are ascribed to the presence of
intrinsic defects.
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