Structural and optical analysis of SnO2 thin films BY Spray Pyrolysis
| dc.contributor.author | S. Roguai | |
| dc.date.accessioned | 2024-02-16T15:44:55Z | |
| dc.date.available | 2024-02-16T15:44:55Z | |
| dc.date.issued | 2020-09-29 | |
| dc.description.abstract | SnO2 thin films were deposited by ultrasound pyrolysis spray technique at 450°C. The films were characterized by X-ray diffraction, Fourier transformed infrared (FTIR), ultraviolet–visible and Photoluminescence spectroscopy. The tetragonal rutile-type structure was confirmed by X-ray diffraction with an average crystallite size of 35 nm. In addition, the FTIR study indicated the existence of two distinct characteristic absorptions which correspond to (0-Sn-O) deformations and (O-Sn) stretching modes. For the optical properties, the band gap energy was determined by WempleDiDomenico model. PL properties are ascribed to the presence of intrinsic defects | |
| dc.identifier.issn | 2437-1114 | |
| dc.identifier.uri | http://dspace.univ-khenchela.dz:4000/handle/123456789/1302 | |
| dc.language.iso | en | |
| dc.title | Structural and optical analysis of SnO2 thin films BY Spray Pyrolysis | |
| dc.title.alternative | Structural and optical analysis of SnO2 thin films BY Spray Pyrolysis | |
| dc.type | Article |
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